Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
by Sheldon Tan
$195.99Paperback
In stock, ships in 1-2 business days
Free standard shipping on orders over $40. ISBN 9783030261740
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Formats and editions
Details
- Format
- Paperback
- ISBN-13
- 9783030261740
- Publisher
- Springer
- Published
- September 25, 2020
- First published
- September 25, 2019
- Pages
- 460
- Weight
- 24.6 oz
- Editions
- 2 (Paperback · Hardcover)
- Subject
- Technology & Engineering
All editions of Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
| Format | Publisher | Published | Pages | ISBN-13 | Price |
|---|---|---|---|---|---|
| Springer | 2020 | 460 | 9783030261740 | $195.99 | |
| Springer | 2019 | 460 | 9783030261719 | $195.99 |
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