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Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics: Volume 990: Symposium Held April 10 12, 20

Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics: Volume 990: Symposium Held April 10 12, 20

by Qinghuang Lin

$47.99Paperback

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Free standard shipping on orders over $40. ISBN 9781107408715

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Details

Format
Paperback
ISBN-13
9781107408715
Publisher
Cambridge University Press
Published
June 5, 2014
Pages
358
Weight
16.8 oz
Subject
Technology & Engineering

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