CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155
CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155
$45.99Paperback
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Free standard shipping on orders over $40. ISBN 9781107408326
1
Formats and editions
Details
- Format
- Paperback
- ISBN-13
- 9781107408326
- Publisher
- Cambridge University Press
- Published
- June 5, 2014
- Pages
- 194
- Weight
- 9.4 oz
- Subject
- Technology & Engineering
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