Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
by Sheldon Tan
$195.99Paperback
In stock, ships in 1-2 business days
Free standard shipping on orders over $40. ISBN 9783030261740
1
Formats and editions
Details
- Format
- Paperback
- ISBN-13
- 9783030261740
- Publisher
- Springer
- Published
- September 25, 2020
- Pages
- 460
- Weight
- 24.6 oz
- Subject
- Technology & Engineering
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