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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Pierre-Richard Dahoo

$182.99Hardcover

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Free standard shipping on orders over $40. ISBN 9781786306401

1

Details

Format
Hardcover
ISBN-13
9781786306401
Publisher
Wiley-Iste
Published
March 16, 2021
Pages
256
Weight
18.6 oz
Subject
Technology & Engineering

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