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Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method

Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method

by Pierre-Richard Dahoo

$182.99Hardcover

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Free standard shipping on orders over $40. ISBN 9781786306876

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Details

Format
Hardcover
ISBN-13
9781786306876
Publisher
Wiley-Iste
Published
April 6, 2021
Pages
288
Weight
19.8 oz
Subject
Technology & Engineering

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