nextRead
Nanometer-Scale Defect Detection Using Polarized Light

Nanometer-Scale Defect Detection Using Polarized Light

by Pierre-Richard Dahoo

$182.99Hardcover

In stock, ships in 1-2 business days

Free standard shipping on orders over $40. ISBN 9781848219366

1

Details

Format
Hardcover
ISBN-13
9781848219366
Publisher
Wiley-Iste
Published
August 22, 2016
Pages
320
Weight
21.8 oz
Subject
Technology & Engineering

More by Pierre-Richard Dahoo

All books

Popular in Technology & Engineering

Browse Technology & Engineering