Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
$67.99Paperback
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Formats and editions
Details
- Format
- Paperback
- ISBN-13
- 9780521031707
- Publisher
- Cambridge University Press
- Published
- November 23, 2006
- Pages
- 408
- Weight
- 22.9 oz
- Subject
- Technology & Engineering
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