Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
$205.99Hardcover
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Formats and editions
Details
- Format
- Hardcover
- ISBN-13
- 9780521554909
- Publisher
- Cambridge University Press
- Published
- July 6, 2000
- Pages
- 406
- Weight
- 39.4 oz
- Subject
- Technology & Engineering
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